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1. Semiconductor Characterization System

v W cc e k U a Z e 2 wW v 4200 SCS i La im Intuitive point and click Windows based environment Unique Remote PreAmps extend the resolution of SMUs to 0 1fA New pulse and pulse I V capabilities for advanced semiconductor testing New scope card provides integrated scope and pulse measure functionality Self contained PC provides fast test setup powerful data analysis graphing and printing and on board mass storage of test re
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